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Handheld X-Ray fluorescence for Coating thickness and Material analysis FISCHERSCOPE XAN 500
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Compact X-Ray fluorescence Model GOLDSCOPE Series for Gold and Precious Metals Analysis
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Specific FISCHERSCOPE XRF instruments for PCB and Wafer Testing
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X-ray fluorescence (XRF) measuring instrument for fast and
non-destructive analysis of gold and silver alloys
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Universal high performance X-ray fluorescence (XRF) measuring instrument
for fast and non-destructive material analysis and coating thickness measurement
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X-ray fluorescence (XRF) measuring instrument with a programmable X/Y-stage
and Z-axis for automated measurements of coating thicknesses and for material analysis
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The FISCHERSCOPE® X-RAY XDAL 600 is designed as a user-friendly XRF bench-top instrument
for non-destructive coating thickness measurements and material analysis.
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High performance X-ray fluorescence (XRF) measuring system with a programmable XY-stage
and Z-axis for automated measurements of very thin coatings and for trace analysis
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High performance X-ray fluorescence (XRF) measuring instrument with vacuum chamber
for non-destructive material analysis
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Calibration standards (reference material) for FISCHERSCOPE® X-RAY fluorescence XRF measuring systems
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Software for all FISCHERSCOPE® X-RAY fluorescence (XRF) measuring systems
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Accessories for FISCHERSCOPE® X-ray fluorescence (XRF) measuring systems
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