FISCHERSCOPE® X-RAY XUV®773
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Features
- Universal premium instrument with comprehensive measurement capabilities
- Outfitted with a measurement chamber that can be evacuated, making it possible to analyse light
elements beginning at Z=11 (Na)
- Automated series testing with precise, programmable XYZ-stage
- Video camera for exact sample positioning and for measuring small sections
Typical fields of applications
- Measurement of light elements
- Measurement of thin coatings and trace analysis
- General materials analysis and forensics
- Non-destructive gemstone analysis
- Photovoltaic industry
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High performance X-ray fluorescence (XRF) measuring instrument with vacuum chamber for non-destructive material analysis
Measurements according to DIN EN ISO 3497 and ASTM B 568
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More information:
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