FISCHERSCOPE^® X-RAY XDL^®

• Robust instrument suited for coating thickness measurements, even at large measuring distances (DCM, stroke 0-80 mm)
• Features a fixed aperture and a fixed filter
• Suitable for structure sizes starting at about 1 mm
• Large and spacious measurement chamber with a cutout (C-slot)
• A programmable stage for automated measurements is available
• Standard X-ray tube, proportional counter tube

Typical fields of applications

• Measurements of mass-produced electroplated parts
• Corrosion protection and decorative coatings such as chrome on nickel/copper
• Bath analysis in the electroplating industry
• Gold, jewellery and watch industries

X-ray fluorescence (XRF) measuring instrument for manual or automated coating thickness measurements on functional coatings, corrosion protection coatings and mass-produced parts
Measurements according to DIN EN ISO 3497 and ASTM B 568

FISCHERSCOPE^® X-RAY XDLM^®

• Very universal because equipped with a micro-focus tube, 4-x aperture changer and 3 primary filters
• Suitable for smaller structures such as connector contacts or printed circuit boards
• Larger measuring distances are possible as well (DCM, stroke 0-80 mm)
• Large and spacious measurement chamber with a cutout (C-slot)
• A programmable stage for automated measurements is available

Typical fields of applications

• Measurement of e.g. thin gold, palladium and nickel coatings in the PC Board industry
• Measurement of coated connectors and contacts
• Measurement of functional coatings in the electronics and semiconductor industries
• Gold, jewellery and watch industries

X-ray fluorescence (XRF) measuring instrument for manual or automated coating thickness measurements and analyses on pc-boards, electronics components and mass-produced parts, even on small components
Measurements according to DIN EN ISO 3497 and ASTM B 568

More information:

• Brochure FISCHERSCOPE^®X-RAY Series