FISCHERSCOPE^® X-RAY 4000

• For continuous measurement of coatings on foils, strips and punched strips in ongoing production
• Measuring head may be positioned at right angles to the transport direction of the specimen
• Easy handling and quick start-up
• Proportional counter tube, peltier-cooled silicon PIN diode or silicon drift detector as X-ray detector
• Positioning device for measurements on several measuring positions
• Customer-specific design
• Automated calibration
• Fast conversion from one production line to another
• Easy integration into quality management systems and process controls

Typical fields of applications

• Strip electroplating, e. g. contacts, stamped components
• Measurement on hot-galvanised strips
• Photovoltaic industry
• Metal coatings on foils and strips
• Electronics industry, suppliers
• Process monitoring

X-ray fluorescence (XRF) measuring system for continuous in-line measurement and analysis in production processes, on flat and stamped strips, also with formed and stamped contact areas

FISCHERSCOPE^® X-RAY 5000

• Flange measuring head for continuous measurements in production lines
• Proportional counter tube, peltier-cooled silicon PIN diode or silicon drift detector as X-ray detector
• Quick and easy calibration on a workpiece master directly in the production process
• For use in air or vacuum
• Allows measurements even on very hot substrate materials up to 500 °C (930 °F)
• Design is focused on maximum robustness and serviceability

Typical fields of applications

• Photovoltaics (CIGS, CIS, CdTe)
• Analysis of thin coatings on metal strip, metal foils and plastic films
• Continuous production
• Process monitoring of sputter and electroplating production lines
• Large-area measurement

X-ray fluorescence (XRF) measuring system for continuous in-line measurement and analysis of thin coatings, i.e. CIGS, CIS, and CdTe, in production processes

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