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FISCHERSCOPE® X-RAY XULM®-PCB
- Robust entry-level instrument with a fixed aperture and one fixed filter,
micro-focus X-ray tube, proportional counter tube as X-ray detector and fixed sample stage
- Option: sample stage extension to enlarge the usable sample placement area to 1200 x 630 mm (47 x 24 in)
- Measuring direction bottom up, this allows for quick and easy sample positioning
Typical fields of applications
- Measurements of functional coatings in the electronics and semiconductor industries
- Determining of the composition of electroplating baths
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FISCHERSCOPE® X-RAY XDLM®-PCB 200
- Robust entry-level instrument with a fixed aperture and one fixed filter,
micro-focus X-ray tube, proportional counter tube as X-ray detector and fixed sample stage
- Option: sample stage extension to enlarge the usable sample placement area to 1200 x 900 mm (47 x 35 in)
- A laser pointer combined with a drawer function serves as a positioning aid
Typical fields of applications
- Measurements of functional coatings in the electronics and semiconductor industries
- Determining of the composition of electroplating baths
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FISCHERSCOPE® X-RAY XDLM®-PCB 210
- Robust entry-level instrument with a fixed aperture and one fixed filter,
micro-focus X-ray tube and proportional counter tube as X-ray detector
- Programmable, motor-driven X/Y table, maximum travel 450 x 300 mm (17.7 x 11.8 in)
Typical fields of applications
- Measurements of functional coatings in the electronics and semiconductor industries
- Determining of the composition of electroplating baths
- Automated measurements, e.g., in quality control
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FISCHERSCOPE® X-RAY XDLM®-PCB 220
- Universally applicable instrument due to changeable apertures and primary filters
- Micro-focus X-ray tube and proportional counter tube as X-ray detector
- Programmable, motor-driven X/Y table, maximum travel 450 x 300 mm (17.7 x 11.8 in)
Typical fields of applications
- Measurements of functional coatings in the electronics and semiconductor industries
- Determining of the composition of electroplating baths
- Automated measurements, e.g., in quality control
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FISCHERSCOPE® X-RAY XDV®-µ PCB
- Equipped with polycapillary X-ray optics for measurements on very small components
- Measurement spot optionally approx. ø 20 µm (0.8 mils) or ø 10 µm (0.4 mils) fwhm at Mo-Ka
- Very high intensities and thus good precision even for thin coatings, measurement uncertainty < 1 nm possible
- Programmable, motor-driven XY table, maximum travel 450 x 300 mm (17.7 x 11.8 in)
Typical fields of applications
- Measurements of functional coatings in the electronics and semiconductor industries
- Measurements on very small flat components and structures on printed circuit boards
- Analysis of very thin coatings, e.g., gold/palladium coatings of ≤ 0.1 µm (0.004 mils)
- Determination of complex multi-coating systems
- Automated measurements, e.g., in quality control
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